Easy to capture accurate, repetitive 2D images and measurements with microscope software | Heisener Electronics
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Easy to capture accurate, repetitive 2D images and measurements with microscope software

Technology Cover
Date de Parution: 2022-04-08, Option NV

    Olympus precv software allows production, quality control and inspection users to make precise, repeatable 2D measurements with results that meet the latest industry standards. The software enables faster, more efficient microscopy workflows with robust data sharing and security features.

    The software controls all Olympus traditional industrial microscopes, their coding functions, their motorized objective converters and digital microscope cameras. And can turn any manual microscope into a comprehensive imaging and measurement platform. It supports bright field, dark field, MIX (Directional dark field), polarization, and DIC imaging for flexibility, and provides strong color rendering and high resolution to provide high-resolution images.

    Advanced Settings remain hidden for new users, while experienced users have easy access to all available features and functions. The home screen can be customised so that the functions used most often and functions can be easily accessed. The software's intuitive interface is easy to use, with a navigation TAB that takes advantage of large, clear label buttons to group software functions such as observation, acquisition and measurement.

    The software facilitates accurate, repeatable 2D measurements on live or recorded images. Powerful features such as automatic edge detection to reliably measure the distance between two points, auxiliary lines to create complex geometric measurements, and the magic wand of automatic area detection give inspectors confidence in their data.

   The EFI function continuously receives multiple images from different focal planes, while the panorama function allows the user to move the stage above the sample and then stitch these images together into a large image. Using this software, you can now combine instant EFI and panoramic images while keeping the user's hand on the microscope. It is also easy to obtain full-focus images beyond the field of view of the microscope.

    For advanced applications such as grain size or non-metallic inclusions, optional material solutions guide users through the steps needed to obtain measurements that conform to the latest standards, including ISO, ASTM and JIS.